Intermediate
Digital Logic Design
Q65 / 100
What is the purpose of "scan chains" (e.g., scan-based DFT) in digital IC testing?
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Incorrect.
The correct answer is A) Scan chains connect a design's flip-flops into a long shift register during test mode, letting test patterns be shifted in and results shifted out, enabling thorough testing without direct access to every internal node
A
Correct Answer
Scan chains connect a design's flip-flops into a long shift register during test mode, letting test patterns be shifted in and results shifted out, enabling thorough testing without direct access to every internal node
Explanation
Design-for-Test (DFT) techniques like scan chains improve manufacturing test coverage by giving external test equipment controllability and observability of internal flip-flop states, which would otherwise be difficult to access directly.
Progress
65/100