What is the role of "scan-based" Automatic Test Pattern Generation (ATPG) in detecting manufacturing defects, and what fault model is commonly targeted?
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The correct answer is A) ATPG tools generate test patterns, often applied via scan chains, to detect specific fault models, most commonly "stuck-at" faults, where a signal is assumed permanently stuck at 0 or 1 due to a defect, with patterns crafted to expose the wrong output
Correct Answer
ATPG tools generate test patterns, often applied via scan chains, to detect specific fault models, most commonly "stuck-at" faults, where a signal is assumed permanently stuck at 0 or 1 due to a defect, with patterns crafted to expose the wrong output
The stuck-at fault model is a simplified abstraction of physical defects (like shorts or opens) that is computationally tractable for automated tools; ATPG generates patterns that, combined with scan chains for controllability/observability, can detect a high percentage of such faults, providing a manufacturing test quality metric (fault coverage).